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    EL

    Detection principle

    · After applying a voltage to the solar cell/module to make it emit light, a near-infrared camera is used to capture its light-emitting image, because the brightness of electroluminescence is proportional to the minority carrier diffusion length

    · The defect emits weak light due to its low minority carrier diffusion length, resulting in a darker image


    Schematic Diagram

    未标题-1.jpg


    Device parameters

    ProjectSpecification
    Model Specifications

    EL140S-M

    Effective test area

    170mm X 170m

    Resolution

    1.4 million pixels

    Sensitivity

    Can detect defects with contrast >5

    Testing time

    0.6s—10s free setting

    Test method

    Probe Contact

    Power parameters

    Single-phase 220V 10A, maximum load voltage 60V, maximum load current 10A

    ConfigurationTest machine (including infrared imager), computer, professional software