• 龙8中国官网唯一入口

    Semiconductor

    Wafer inspection machine

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    Device parameters:

    · Capacity: ≥ 8ppm;

    · Accuracy rate: ≥ 95%;

    · Utilization rate: ≥ 95% (caused only by the equipment itself);

    · Missing detection rate: 0;

    · False detection rate: ≤ 5%;


    Installation environment requirements:

    · Power requirement: 380VAC, 50Hz ≤40KW;

    · Compressed air source: 0.4~0.7MPa ≤1000L/H;

    · Ambient temperature: room temperature +10°~+45°;

    · Relative humidity: ≯50%, no condensation, no corrosive, flammable gas.